Computer simulation results are reported on transistor design and single-event charge collection modeling of metalsemiconductor field effect transistors (MESFETs) fabricated in the Vitesse H-GaAsIII@ process on Low Temperature grown (LT) GaAs epitaxial layers. Tradeoffs in Single Event Upset (SEU) immunity and transistor design are discussed. Effects due to active loads and diffusion barriers are examined.
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