No abstract

A monolithic polycapillary focusing optic was tested in the microbeam x-ray fluorescence system at the Oak Ridge Center for Manufacturing Technology. The optic was designed to cover a wide energy range from 4 keV to 20 keV. The focal spot size of the output beam at 17.4 keV (Mo Kα) was measured to be 21 μm full width of half maximum. An average beam intensity of 1.5×105 photon/s/μm2 was obtained at the focus for Mo Kα line using a 12 W microfocus x-ray source. This intensity is about 2400 times over that of a direct beam at 100 mm away from the x-ray source. The small, intense x-ray beam obtained was used to analyze and map the compositions of different elements in industrial samples.

Note: Comparison of grazing incidence small angle x-ray scattering of a titania sponge structure at the beamlines BW4 (DORIS III) and P03 (PETRA III) Rev. Sci. Instrum. 83, 106104 (2012) Soft x-ray images of the laser entrance hole of ignition hohlraums Rev. Sci. Instrum. 83, 10E525 (2012) Pinned, optically aligned diagnostic dock for use on the Z facility Rev. Sci. Instrum. 83, 10D714 (2012) Experimental and simulation study of undesirable short-period deformation in piezoelectric deformable x-ray mirrors Rev. Sci. Instrum. 83, 053701 (2012) Determination of the temperature of bremsstrahlung photon generated by ultraintense laser using various thickness attenuators Rev. Sci. Instrum. 82, 033301 (2011) Additional information on Appl. Phys. Lett.

SummaryThe 'moving-screen' or 'pattern magnification' method of calibration for electron backscatter diffraction (EBSD) was reformulated to develop a high-precision technique requiring no crystallographic knowledge of the specimen and no initial estimates of the calibration parameters. The technique depends upon the accurate displacement of the screen and camera assembly. Corresponding points are selected, interactively, from EBSD patterns. It is suggested that, as an alternative, the selection of points from the Hough transform could lead to a completely automated routine.

Approximately 40 mixed oxide materials were prepared and characterized primarily as to their thermal expansion and melting-point behavior. Of particular interest were those materials which were stable, had melting points in excess of 1,4000 C, and had low thermal expansions.