Two methods based on one-port measurements are introduced for intrinsic efficiency calibration of low loss waveguide section. One of the methods are similar to the multiline one-port (ML1P) technique, which are proposed by Wiatr. While, we change the ML1P method slightly by using a flush short and a 1/4 offset short. The other method takes advantage of the developed function of PNA-X. After statements of calibration procedures for a U band waveguide section, calibration results are compared with the theory calculation value.
Sophisticate mathematic computation is used when the residual error parameters are estimated employing time domain technique. This paper discuss the improved method of employing Window function before the inverse Fourier transform. At the same time, we find the curve of time domain will be out of the standard shape when the linear prediction of the measured signal section is too long, and some figures are offered to illustrate it.
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