In semiconductor manufacturing for automotive, reliability constraints are strong: zero defect is expected by specific statistical techniques. In particular, distributions of the parametric electrical tests implemented at the probe or assembly steps, are controlled, test by test. In order to increase reliability in field by enhancement of potential failure screening, new techniques of test result distribution monitoring are studied with a multivariate approach, when all the test results are addressed simultaneously.
Abstract-Improving single well failure repair efficiency by implementing Six Sigma DMAIC process for single well failure repair system in oil field. The problem is defined in strict accordance with the DMAIC process approach, clarify the scope of the process and improve the objectives. Then analyzing the main defects in single well fault repair, and evaluating and optimizing the related measurement systems. On this basis, further analysis of the root cause of the low efficiency of repair, and set the solution to the single well failure repair level of defects reduced to DPHU less than 2, while repair speed significantly improved.Finally, the key quality of the process to establish a sound control mechanism and corrective measures to ensure that improvements can be maintained. The application of DMAIC process in improving single-well failure repair can enhance the disposal ability in oilfield production process when facing unexpected problems.
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