As technology continues towards smaller, thinner and lighter devices, more stringent demands are placed on thin polymer films as diffusion barriers, dielectric coatings, electronic packaging and so on. Therefore, there is a growing need for testing platforms to rapidly determine the mechanical properties of thin polymer films and coatings. We introduce here an elegant, efficient measurement method that yields the elastic moduli of nanoscale polymer films in a rapid and quantitative manner without the need for expensive equipment or material-specific modelling. The technique exploits a buckling instability that occurs in bilayers consisting of a stiff, thin film coated onto a relatively soft, thick substrate. Using the spacing of these highly periodic wrinkles, we calculate the film's elastic modulus by applying well-established buckling mechanics. We successfully apply this new measurement platform to several systems displaying a wide range of thicknessess (nanometre to micrometre) and moduli (MPa to GPa).
Surface instabilities in soft matter have been the subject of increasingly innovative research aimed at better understanding the physics of their formation and their utility in patterning, organizing, and measuring materials properties on the micro and nanoscale. The focus of this Review is on a type of instability pattern known as surface wrinkling, covering the general concepts of this phenomenon and several recent applications involving the measurement of thin-film properties. The ability of surface wrinkling to yield new insights into particularly challenging materials systems such as ultrathin films, polymer brushes, polyelectrolyte multilayer assemblies, ultrasoft materials, and nanoscale structured materials is highlighted. A perspective on the future directions of this maturing field, including the prospects for advanced thin-film metrology methods, facile surface patterning, and the control of topology-sensitive phenomena, such as wetting and adhesion, is also presented.
The elastic moduli of ultrathin poly(styrene) (PS) and poly(methylmethacrylate) (PMMA) films of thickness ranging from 200 nm to 5 nm were investigated using a buckling-based metrology. Below 40 nm, the apparent modulus of the PS and PMMA films decreases dramatically, with an order of magnitude decrease compared to bulk values for the thinnest films measured. We can account for the observed decrease in apparent modulus by applying a composite model based on the film having a surface layer with a reduced modulus and of finite thickness. The observed decrease in the apparent modulus highlights issues in mechanical stability and robustness of sub-40 nm polymer films and features.
We examine the wettability of rough surfaces through a measurement approach that harnesses a wrinkling instability to produce model substrate topographies. Specifically, we probe the wetting of liquids on anisotropic micro-wrinkled features that exhibit well-defined aspect ratios (amplitude versus wavelength of the wrinkles) that can be actively tuned. Our study provides new insight into the wetting behavior on rough surfaces and into the interpretation of related liquid contact-angle measurements. In particular, we find that droplet wetting anisotropy is governed primarily by the roughness aspect ratio. In addition, comparison of our measurements to theoretical models demonstrates that droplet distortions and observed contact angles on surfaces with a strongly anisotropic texture can be quantitatively attributed to the difference in the energetic barriers to wetting along and perpendicular to substrate features.
Thickness is a governing factor in the behavior of films and coatings. To enable the high-throughput analysis of this parameter in polymer systems, we detail the design and operation of a "flow coater" device for fabricating continuous libraries of polymer film thickness over tailored ranges. Focusing on the production of model polystyrene film libraries, we thoroughly outline the performance of flow coating by varying critical factors including device geometry, device motion, and polymer solution parameters.
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