The magnetization behavior and the domain pattern in remanence are studied in Co/Pt multilayers. The reorientation of magnetization from perpendicular to in plane is found to happen via the state of canted magnetization. In the transition from an easy axis to an easy plane a stable domain pattern in the in-plane magnetization components is found for Co/Pt multilayers. The analysis of the domain pattern reveals that the magnetization canting is such that all in-plane orientations of magnetization are equally occupied. The found structure is appointed to the cone state.

The magnetic anisotropy of Co/Pt multilayers is investigated. The perpendicular uniaxial anisotropy is discussed in second order approximation under a variation in Co and Pt layer thicknesses. The evolution of anisotropy constants is shown in the phase diagram of first and second order anisotropy constants. A thickness driven spin reorientation via the canted phase is observed for a single Co layer as well as for Co/Pt multilayer films.

We report on Fourier transform holography (FTH) experiments on nanostructured Co/Pt multilayer films with 40 nm spatial imaging resolution. The films have been nanostructured by means of focused ion beam (FIB) milling. Applying the ion beam through the supporting membrane with controlled and homogeneous dosing allows for higher resolution magnetic structuring of the ion-sensitive film compared to direct FIB patterning. Nanostructured samples with magnetic stripes exposed to different ion doses and magnetic arrays with 200 nm lattice constant were successfully prepared and imaged by FTH. We present image-processing routines for artifact-free image reconstruction. With this, we could investigate the FIB-induced anisotropy modulation and the perpendicular domain structure in the nanostructured samples, showing how to control the domain size and configuration by applying the appropriate ion dose either homogeneously or concentrated in single spots.

We present a new x-ray microscopy technique based on Fourier transform holography FTH, where the sample is separate from the optics part of the setup. The sample can be shifted with respect to the holography optics, thus large-scale or randomly distributed objects become accessible. As this extends FTH into a true microscopy technique, we call it x-ray holographic microscopy XHM. FTH allows nanoscale imaging without the need for nanometer-size beams. Simple Fourier transform yields an unambiguous image reconstruction. We demonstrate XHM by studying the magnetic domain evolution of a Co/Pt multilayer film as function of locally varied iron overlayer thickness.