We experimentally observe the characteristic relations of type-I intermittency ͓C.-M. Kim et al., Phys. Rev. Lett. 73, 525 ͑1994͔͒ in an inductance-resistance-diode circuit. Near a bifurcation point, the reinjection probability distribution is of the form x Ϫ1/2 , and the characteristic relations are of the form ͗l͘ϰ⑀ Ϫ1/4 and constant when the lower bounds of the reinjection are at and above the tangent point, respectively. The results agree well with theoretical predictions. ͓S1063-651X͑97͒01009-X͔ PACS number͑s͒: 05.45.ϩb, 07.50.Ek
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