The integration of efficient, miniaturized group IV lasers into CMOS architecture holds the key to the realization of fully functional photonic-integrated circuits. Despite several years of progress, however, all group IV lasers reported to date exhibit impractically high thresholds owing to their unfavourable bandstructures. Highly strained germanium with its fundamentally altered bandstructure has emerged as a potential low-threshold gain medium, but there has yet to be a successful demonstration of lasing from this seemingly promising material system. Here we demonstrate a low-threshold, compact group IV laser that employs a germanium nanowire under a 1.6% uniaxial tensile strain as the gain medium. The amplified material gain in strained germanium can sufficiently overcome optical losses at 83 K, thus allowing the observation of multimode lasing with an optical pumping threshold density of ~3.0 kW cm−2. Our demonstration opens new possibilities for group IV lasers for photonic-integrated circuits.

This study investigated the temperature dependence of the Auger recombination coefficient (C) in an InGaN/GaN blue multiple-quantum-well (MQW) light-emitting diode structure at temperatures between 20 and 100°C. The temperature dependence of C was determined by fitting the measured external quantum efficiency (EQE) data using an analytical model or numerical simulation. In the analytical model, the carrier density in InGaN MQWs was assumed to be constant and independent of temperature. In contrast, the inhomogeneous carrier distribution in MQWs and its temperature-dependent redistribution were included in the numerical simulation. When the analytical model was employed to fit the EQE curve, C decreased with increasing temperature. On the other hand, when the numerical simulation was employed, C increased steadily by ∼31% as the temperature was increased from 20 to 100°C. We found that the temperature-dependent carrier distribution is important to consider when determining the temperature dependence of the Auger recombination coefficient in InGaN MQW structures.

We investigate the junction temperature measurements for GaN-based blue light emitting diodes (LEDs) using nonlinear dependence of the forward voltage (V f ) on temperature. Unlike the conventional linear model of the dependence of V f on temperature, the modeling of the temperature dependent V f with a quadratic function showed good agreements with measured data in the temperature range between 20 and 100 o C. Using the proposed quadratic model, the junction temperature and thermal resistance of the measured LED could be accurately determined as the ambient temperature varied. It was observed that the junction temperature increment remained almost unchanged as the ambient temperature increased from 20 to 80 o C, which could be attributed to the interplay between the decrease in series resistance and the increase in non-radiative recombination with increasing temperature. The presented method for accurate determination of the junction temperature is expected to be advantageously employed for the thermal management of high-power LEDs.

In GaN-based laser diode (LD) structures, Mg doping in p-type-doped layers has a significant influence on the device performance. As the doping concentration increases, the operation voltage decreases, whereas the output power decreases as a result of increased optical absorption, implying that optimization of the Mg doping concentration is required. In this study, we systematically investigated the effect of the Mg doping concentration in the AlGaN electron-blocking layer (EBL) and the AlGaN p-cladding layer on the output power, forward voltage, and wall-plug efficiency (WPE) of InGaN blue LD structures using numerical simulations. In the optimization of the EBL, an Al composition of 20% and an Mg doping concentration of 3 × 1019 cm−3 exhibited the best performance, with negligible electron leakage and a high WPE. The optimum Mg concentration of the p-AlGaN cladding layer was found to be ~1.5 × 1019 cm−3, where the maximum WPE of 38.6% was obtained for a blue LD with a threshold current density of 1 kA/cm2 and a slope efficiency of 2.1 W/A.

We compared the efficiency droop of InGaN multiple-quantum-well (MQW) blue light-emitting diode (LED) structures grown on silicon(111) and c-plane sapphire substrates and analyzed the efficiency droop characteristics using the rate equation model with reduced effective active volume. The efficiency droop of the LED sample on silicon was observed to be reduced considerably compared with that of the identical LED sample on sapphire substrates. When the measured external quantum efficiency was fitted with the rate equation model, the effective active volume of the MQW on silicon was found to be ~1.45 times larger than that of the MQW on sapphire. The lower efficiency droop in the LED on silicon could be attributed to its larger effective active volume compared with the LED on sapphire. The simulation results showed that the effective active volume decreased as the internal electric fields increased, as a result of the reduced overlap of the electron and hole distribution inside the quantum well and the inhomogeneous carrier distribution in the MQWs. The difference in the internal electric field of the MQW between the LED on silicon and sapphire could be a major reason for the difference in the effective active volume, and consequently, the efficiency droop.