A two-components model has been recently developed, for describing the normalized bulk pinning force curves and the critical current density of NbTi strands over a wider B-T range with respect to conventional single-component models. The model was previously successfully applied to data collected on several NbTi commercial strands, with different size, Cu:nonCu ratio, filament diameter and layout, thus confirming the presence of two different pinning mechanisms in conventionally processed NbTi wires. For a further validation, we have extensively tested a strand recently produced by the Chinese Company Western Superconducting Technologies for the ITER Poloidal Field (PF) magnets PF2 to PF5, and applied the model to these data. In order to take into account the observed non-scaling with temperature of the reduced pinning force curves, the model has been updated, including the observed difference in the temperature dependences of the two components contributing to the overall bulk pinning force. The importance of testing wires over very wide temperature ranges is evidenced, and the good agreement between experimental and fit results validate the proposed formulation, which can be regarded as a reliable tool for the description of NbTi performances, to be used in the design of superconducting magnets. From the phenomenological point of view, it is shown that at low temperatures, the two pinning mechanisms contribute to the bulk pinning force, resulting in a pinning force peaking at a reduced field . As the temperature increases, the pinning force peak moves to lower fields, indicating that the low field component pinning mechanism becomes dominant.
For the protection of the LHC superconducting magnets, about 2100 specially developed by-pass diodes were manufactured by DYNEX SEMICONDUCTOR LTD (Lincoln, GB) and about 1300 of these diodes were mounted into diode stacks and submitted to tests at cryogenic temperatures. To date about 800 dipole diode stacks and about 250 quadrupole diode stacks for the protection of the superconducting lattice dipole and lattice quadrupole magnets have been assembled at OCEM (Bologna,Italy) and successfully tested in liquid helium at ENEA (Frascati, Italy). This report gives an overview of the test results obtained so far. After a short description of the test installations and test procedures, a statistical analysis is presented for test data during diode production as well as for the performance of the diode stacks during testing in liquid helium, including failure rates and degradation of the diodes.
CRYOGENIC TESTING OF HIGH CURRENT BY-PASS DIODE STACKS FOR THE PROTECTION OF THE SUPERCONDUCTING MAGNETS IN THE LHC
ABSTRACTFor the protection of the LHC superconducting magnets, about 2100 specially developed by-pass diodes were manufactured by DYNEX SEMICONDUCTOR LTD (Lincoln, GB) and about 1300 of these diodes were mounted into diode stacks and submitted to tests at cryogenic temperatures. To date about 800 dipole diode stacks and about 250 quadrupole diode stacks for the protection of the superconducting lattice dipole and lattice quadrupole magnets have been assembled at OCEM (Bologna,Italy) and successfully tested in liquid helium at ENEA (Frascati, Italy). This report gives an overview of the test results obtained so far. After a short description of the test installations and test procedures, a statistical analysis is presented for test data during diode production as well as for the performance of the diode stacks during testing in liquid helium, including failure rates and degradation of the diodes.
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