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Abstract:We propose a spectral-domain interferometric technique, termed spectral modulation interferometry (SMI), and present its application to high-sensitivity, high-speed, and speckle-free quantitative phase imaging. In SMI, one-dimensional complex field of an object is interferometrically modulated onto a broadband spectrum. Full-field phase and intensity images are obtained by scanning along the orthogonal direction. SMI integrates the high sensitivity of spectral-domain interferometry with the high speed of spectral modulation to quantify fast phase dynamics, and its dispersive and confocal nature eliminates laser speckles. The principle and implementation of SMI are discussed. Its performance is evaluated using static and dynamic objects.

We propose an interferometric spectral multiplexing method for measuring birefringent specimens with simple configuration and high sensitivity. The retardation and orientation of sample birefringence are simultaneously encoded onto two spectral carrier waves, generated interferometrically by a birefringent crystal through polarization mixing. A single interference spectrum hence contains sufficient information for birefringence determination, eliminating the need for mechanical rotation or electrical modulation. The technique is analyzed theoretically and validated experimentally on cellulose film. System simplicity permits the possibility of mitigating system birefringence background. Further analysis demonstrates the technique's exquisite sensitivity as high as ∼20  pm for retardation measurement.

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