A high-performance novel photodetector is demonstrated, which consists of graphene and CH3 NH3 PbI3 perovskite layers. The resulting hybrid photodetector exhibits a dramatically enhanced photo responsivity (180 A/W) and effective quantum efficiency (5× 10(4) %) over a broad bandwidth within the UV and visible ranges.
An unconventional phase-change memory (PCM) made of In Se , which utilizes reversible phase changes between a low-resistance crystalline β phase and a high-resistance crystalline γ phase is reported for the first time. Using a PCM with a layered crystalline film exfoliated from In Se crystals on a graphene bottom electrode, it is shown that SET/RESET programmed states form via the formation/annihilation of periodic van der Waals' (vdW) gaps (i.e., virtual vacancy layers) in the stack of atomic layers and the concurrent reconfiguration of In and Se atoms across the layers. From density functional theory calculations, β and γ phases, characterized by octahedral bonding with vdW gaps and tetrahedral bonding without vdW gaps, respectively, are shown to have energy bandgap value of 0.78 and 1.86 eV, consistent with a metal-to-insulator transition accompanying the β-to-γ phase change. The monolithic In Se layered film reported here provides a novel means to achieving a PCM based on melting-free, low-entropy phase changes in contrast with the GeTe-Sb Te superlattice film adopted in interfacial phase-change memory.
This work investigates the use of oxygen plasma (O 2 ) treatment, applied as an inductively coupled plasma, to control the thickness and work function of a MoS 2 layer. Plasma-etched MoS 2 exhibited a surface roughness similar to that of the pristine MoS 2 . The MoS 2 field effect transistors fabricated using the plasma-etched MoS 2 displayed a higher n-type doping concentration than that of pristine MoS 2 . The x-ray photoelectron spectroscopy was performed to analyze chemical composition to demonstrate the minimum level of chemical reactions occurred upon plasma treatment. Moreover, Kelvin probe force microscopy measurements were conducted to probe the changes in the work function that could be attributed to the changes in the surface potential. The measured work functions suggest the modification of a band structure and n-doping effect after plasma treatments that depended on the number of MoS 2 layers. This study suggests that the O 2 plasma can control the layer number of the MoS 2 as well as the electronic properties of a MoS 2 film.
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