Gold eutectic bonding of silicon wafers is a good candidate for wafer level vacuum packaging of vibrating MEMS: in this paper we investigated several ebeam evaporated metallizations stacks including a titanium adhesion layer, an optional diffusion barrier (Ni or Pt) and a gold film for eutectic bonding on Si and SiO 2 / Si wafers. Interdiffusion in the multilayers for annealing temperatures (380-430°C) larger than the Au-Si eutectic temperature (363°C) and times corresponding to a bonding process was characterized by RBS, roughness and resistivity measurements. Au/Pt/Ti and Au/Ti/SiO 2 were found to have the best characteristics for bonding. This was confirmed by bonding experiments.
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