One of the major problems faced by electronic board designers, manufacturing engineers and This paper presents an interactive MS-field engineers is to have automatic, cheap, and Windows @.based tool for high-level specification fast ways of checking the operation of integrated and analysis of tests on printed circuit boards, circuits. A similar problem is faced by integrated using the IEEE 1149.1 standard, and also on circuit designers, when they receive their chips integrated circuits using scan design like the from the silicon foundry .Without appropriate LSSD testing methodology. As novel contributions support, testing boards and chips can be a very we provide an object-oriented tool for Boundary difficult task. Scan and LSSD test automation with support for remote tests, including interfaces to circuit Without a design for testability philosophy description, chip interconnection, test vector employed at design time, the designer has to build analysis and test vector generation. The system is an extemal hardware for each different chip to be a reasona'.Jly complete CAE test system that tested and drive its I/O pins using many different includes features like remote testing (using client-combinations of the inputs to have a sma11 degree server technology), project management, of certainty about circuit operation. However, the computer-aided learning support, menu-based major problems are: how can it be guaranteed command entry, user-defined configuration and a that a11 possible faults (in the fault model) can be comprehensive set of commands. Thus, by using detected ? How to fmd out where the problem is? this system, a test engineer or a circuit designer Unfortunately, the problem becomes much worse are able to specify and verify tests for printed when the number of pins increases. Among the circuit boards or for integrated circuits, either design for testability (DFT) methodologies locally or remotely. employed by IC designers two of the most efficient are scan design for external test and 1. Introduction built-in selftest (BIST).
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.
hi@scite.ai
10624 S. Eastern Ave., Ste. A-614
Henderson, NV 89052, USA
Copyright © 2024 scite LLC. All rights reserved.
Made with 💙 for researchers
Part of the Research Solutions Family.