Abstract-Thermoelectric (TE) modules are solid-state devices that convert directly thermal energy in electrical energy. However, they can undergo performance degradation due to thermal cycling. In the present study, a control-based test platform that is capable to apply specific thermal cycling pattern at periodic intervals is presented in order to evaluate performance degradation that influence the TE module lifetime. Using this test platform, some parameters and the figure of merit ZT of a commercial TE module are measured before and after thermal cycling application. An important feature of the proposed platform is that the applied thermal cycling is bipolar, that is, it is possible to apply positive or negative temperature difference and, through this, performance degradation would be observed after only 548 thermal cycles much lower than previous works.

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This DOI was registered to an article that was not presented by the author(s) at this conference. As per section 8.2.1.B.13 of IEEE's "Publication Services and Products Board Operations Manual," IEEE has chosen to exclude this article from distribution.We regret any inconvenience.

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Resumo-A Amostragem Compressiva explora a esparsidade do sinal em um determinado domínio para capturar em um formato no tempo discreto apenas a informação contida no sinal, usando uma taxa de aquisição menor que a de Nyquist. O conversor analógico para informação (do inglês, Analog-to-Information Converter-AIC)é a implementação física da Amostragem Compressiva e tem seu desempenho bastante degradado com a presença de ruído. Neste artigoé analisado o desempenho de um AIC simulado no ambiente MATLAB R /Simulink, adicionando ruído gaussiano ao sinal de entrada. Utilizando a relação sinalruído e distorção (do inglês, Signal-to-Noise and Distortion Ratio-SINAD) observou-se uma queda de desempenho de 10dB quando o ruídoé adicionado.