This paper presents an empirical study on the impact of maintenance function on more sustainable manufacturing processes. The work methodology comprises four stages. At first, ten factors of maintenance activities from a sustainable manufacturing point of view were identified. Then, in the second stage, the matrix of crossed impact multiplications applied to a classification (MICMAC) was carried out to categorize these factors based on their influence and dependence values. In the third stage, the criteria for evaluation of maintenance factors were defined, then the fuzzy analytic hierarchy process (F-AHP) was applied to determine their relative weights. In the last stage, the results of MICMAC and F-AHP analyses were used as inputs for the fuzzy technique for order preference by similarity to ideal solution (F-TOPIS) to generate aggregate scores and selection of the most important maintenance factors that have an impact on sustainable manufacturing processes. A numerical example is provided to demonstrate the applicability of the approach. It was observed that factors “Implementation of preventive and prognostic service strategies”, “The usage of M&O data collection and processing systems”, and “Modernization of machines and devices” are the major factors that support the realization of sustainable manufacturing process challenges.

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Nowadays, due to the advancement of design and manufacturing technology, there are many consumer products with high reliability. Similarly, the competition in the business sector influences the product development time to become shorter and that makes it difficult for manufacturers to evaluate the reliability of current products before new products are released to the market. This phenomenon is manifested in the lighting industry, especially for the high power white light-emitting diodes (LEDs) as these products have a long lifetime and high reliability. Currently, the standard to predict the lifetime of LEDs is based on a deterministic nonlinear least squares method which has low prediction accuracy. To overcome this, degradation models are being used to study the reliability of such products, considering the uncertainties and the quality characteristics whose degradation over a period of time can be related to the product lifetime. A stochastic approach based on gamma distributed degradation (GDD) is proposed in this study to estimate the long-term lumen degradation lifetime of phosphor-converted white LEDs. An accelerated thermal degradation test was designed to gather luminous flux degradation data which was analyzed based on maximum likelihood estimation (MLE) and the method of moments (MM) to estimate the parameters for the GDD model. The MLE method has shown superiority over MM in terms of the estimation of the model parameters due to its iterative algorithm being likely to find the optimal estimation. The lifetime prediction results show that the accuracy of the proposed method is much better than the TM-21 nonlinear least squares (NLS) approach which makes it promising for future industrial applications.

The lifetime prediction using accelerated degradation test (ADT) method has become a main issue for white light emitting diodes applications. This paper proposes a novel lifetime model for light emitting diodes (LEDs) under thermal and electrical stresses, where the junction temperature and driving current are deemed the input parameters for lifetime prediction. The features of LEDs’ lifetime and the law of lumen depreciation under dual stresses are combined to build the lifetime model. The adoption of thermal and electrical stresses overcomes the limitation of single stress, and junction temperature in accelerated degradation test as thermal stress is more reliable than ambient temperature in conventional ADT. Furthermore, verifying applications and cases studies are discussed to prove the practicability and generality of the proposed lifetime model. In addition, the lifetime model reveals that electrical stress is equally significant to the thermal stress in the degradation of LEDs, and therefore should not be ignored in the investigation on lumen decay of LEDs products.