A novel sensing peak identification method for high accuracy refractive index (RI) sensing is proposed. The implementation takes the intensity of interference maximum as the characteristic to distinguish interference peaks, tracking the sensing peak continually during a RI changes, with high measurement accuracy and simple computation. To verify the effect of the method, the extrinsic Fabry–Perot interferometer (EFPI) sensor has been fabricated using the large lateral offset splicing technique. In the RI range from 1.346 to 1.388, the measurement range of the EFPI with the proposed method reaches at least 6 times larger than that of EFPI with the wavelength tracking method and the largest measurement error is −4.47 × 10−4. The EFPI refractive index (RI) sensor identified the sensing peak is believed to play an important role in RI, concentration and density sensing, etc., for superior performance.
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