Specific morphological features of polymer semiconductors are often promoted in devices to optimize optoelectronic behavior. Less studied is the role of morphology on the mechanical properties of the film, such as elastic modulus, which is an important property for the development of flexible and stretchable devices. To gain insight into the morphological origin of elasticity in polymer semiconductors and its relationship to charge transport, we study the anisotropic in-plane elastic modulus of strain-aligned regioregular poly(3-hexylthiophene) (P3HT) films and compare the results to previously measured field effect charge mobility. The film morphology is varied through the amount of applied strain and post strain thermal annealing. Morphological characterization includes UV−vis optical spectroscopy and X-ray diffraction. The elastic modulus is measured using a buckling-based measurement technique. The elastic modulus of the film is found to decrease as the film is plastically strained. Thermally annealing the strained films results in a large in-plane elastic modulus anisotropy, where the modulus increases in the direction of backbone alignment and decreases in the transverse direction. The measured elastic modulus is compared to the film morphology, showing a dependence on both in-plane polymer chain alignment and local aggregate order. Comparing the elastic modulus to field effect mobility shows that they are not necessarily correlated, which has important implication for flexible organic electronic device design.
Large charge mobilities of semi-crystalline organic semiconducting films could be obtained by mechanically aligning the material phases of the film with the loading axis. A key element is to utilize the inherent stiffness of the material for optimal or desired alignment. However, experimentally determining the moduli of semi-crystalline organic thin films for different loading directions is difficult, if not impossible, due to film thickness and material anisotropy. In this paper, we address these challenges by presenting an approach based on combining a composite mechanics stiffness orientation formulation with a Gaussian statistical distribution to directly estimate the in-plane stiffness (transverse isotropy) of aligned semi-crystalline polymer films based on crystalline orientation distributions obtained by X-ray diffraction experimentally at different applied strains. Our predicted results indicate that the in-plane stiffness of an annealing film was initially isotropic, and then it evolved to transverse isotropy with increasing mechanical strains. This study underscores the significance of accounting for the crystalline orientation distributions of the film to obtain an accurate understanding and prediction of the elastic anisotropy of semi-crystalline polymer films.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.