The use of low-dose computed tomography (LDCT) in medical practice can effectively reduce the radiation risk of patients, but it may increase noise and artefacts, which can compromise diagnostic information. The methods based on deep learning can effectively improve image quality, but most of them use a training set of aligned image pairs, which are difficult to obtain in practice. In order to solve this problem, on the basis of the Wasserstein generative adversarial network (GAN) framework, we propose a generative adversarial network combining multi-perceptual loss and fidelity loss. Multi-perceptual loss uses the high-level semantic features of the image to achieve the purpose of noise suppression by minimizing the difference between the LDCT image and the normal-dose computed tomography (NDCT) image in the feature space. In addition, L2 loss is used to calculate the loss between the generated image and the original image to constrain the difference between the denoised image and the original image, so as to ensure that the image generated by the network using the unpaired images is not distorted. Experiments show that the proposed method performs comparably to the current deep learning methods which utilize paired image for image denoising.
Hyperspectral Images (HSIs) contain enriched information due to the presence of various bands, which have gained attention for the past few decades. However, explosive growth in HSIs’ scale and dimensions causes “Curse of dimensionality” and “Hughes phenomenon”. Dimensionality reduction has become an important means to overcome the “Curse of dimensionality”. In hyperspectral images, labeled samples are more difficult to collect because they require many labor and material resources. Semi-supervised dimensionality reduction is very important in mining high-dimensional data due to the lack of costly-labeled samples. The promotion of the supervised dimensionality reduction method to the semi-supervised method is mostly done by graph, which is a powerful tool for characterizing data relationships and manifold exploration. To take advantage of the spatial information of data, we put forward a novel graph construction method for semi-supervised learning, called SLIC Superpixel-based l 2 , 1 -norm Robust Principal Component Analysis (SURPCA2,1), which integrates superpixel segmentation method Simple Linear Iterative Clustering (SLIC) into Low-rank Decomposition. First, the SLIC algorithm is adopted to obtain the spatial homogeneous regions of HSI. Then, the l 2 , 1 -norm RPCA is exploited in each superpixel area, which captures the global information of homogeneous regions and preserves spectral subspace segmentation of HSIs very well. Therefore, we have explored the spatial and spectral information of hyperspectral image simultaneously by combining superpixel segmentation with RPCA. Finally, a semi-supervised dimensionality reduction framework based on SURPCA2,1 graph is used for feature extraction task. Extensive experiments on multiple HSIs showed that the proposed spectral-spatial SURPCA2,1 is always comparable to other compared graphs with few labeled samples.
Semisupervised Discriminant Analysis (SDA) is a semisupervised dimensionality reduction algorithm, which can easily resolve the out-of-sample problem. Relative works usually focus on the geometric relationships of data points, which are not obvious, to enhance the performance of SDA. Different from these relative works, the regularized graph construction is researched here, which is important in the graph-based semisupervised learning methods. In this paper, we propose a novel graph for Semisupervised Discriminant Analysis, which is called combined low-rank and k-nearest neighbor (LRKNN) graph. In our LRKNN graph, we map the data to the LR feature space and then the kNN is adopted to satisfy the algorithmic requirements of SDA. Since the low-rank representation can capture the global structure and the k-nearest neighbor algorithm can maximally preserve the local geometrical structure of the data, the LRKNN graph can significantly improve the performance of SDA. Extensive experiments on several real-world databases show that the proposed LRKNN graph is an efficient graph constructor, which can largely outperform other commonly used baselines.
Classification of Hyperspectral Images (HSIs) has gained attention for the past few decades. In remote sensing image classification, the labeled samples are insufficient or hard to obtain; however, the unlabeled ones are frequently rich and of a vast number. When there are no sufficient labeled samples, overfitting may occur. To resolve the overfitting issue, in this present work, we proposed a novel approach for HSI feature extraction, called robust regularized Block Low-Rank Discriminant Analysis (BLRDA), which is a robust and efficient feature extraction method to improve the HSIs' classification accuracy with few labeled samples. To reduce the exponentially growing computational complexity of the low-rank method, we divide the entire image into blocks and implement the low-rank representation for each block respectively. Due to the symmetric matrix requirements for the regularized graph of discriminant analysis, the k-nearest neighbor is applied to handle the whole low-rank graph integrally. The low-rank representation and the kNN can maximally capture and preserve the global and local geometry of the data, respectively, and the performance of regularized discriminant analysis feature extraction can be apparently improved. Extensive experiments on multi-class hyperspectral images show that the proposed BLRDA is a very robust and efficient feature extraction method. Even with simple supervised and semi-supervised classifiers (nearest neighbor and SVM) and randomly given parameters, the feature extraction method achieves significant results with few labeled samples, which shows better performance than similar feature extraction methods.
Unlike Support Vector Machine (SVM), Multiple Kernel Learning (MKL) allows datasets to be free to choose the useful kernels based on their distribution characteristics rather than a precise one. It has been shown in the literature that MKL holds superior recognition accuracy compared with SVM, however, at the expense of time consuming computations. This creates analytical and computational difficulties in solving MKL algorithms. To overcome this issue, we first develop a novel kernel approximation approach for MKL and then propose an efficient Low-Rank MKL (LR-MKL) algorithm by using the Low-Rank Representation (LRR). It is well-acknowledged that LRR can reduce dimension while retaining the data features under a global low-rank constraint. Furthermore, we redesign the binary-class MKL as the multiclass MKL based on pairwise strategy. Finally, the recognition effect and efficiency of LR-MKL are verified on the datasets Yale, ORL, LSVT, and Digit. Experimental results show that the proposed LR-MKL algorithm is an efficient kernel weights allocation method in MKL and boosts the performance of MKL largely.
Strip steel surface defect recognition is a pattern recognition problem with wide applications. Previous works on strip surface defect recognition mainly focus on feature selection and dimension reduction. There are also approaches on real-time systems that mainly exploit the autocorrection within some given picture. However, the instances cannot be used in practical applications because of a bad recognition rate and low efficiency. In this paper, we study the intelligent algorithm of strip steel surface defect recognition, where the goal is to improve the accuracy and save running time. This problem is very important in various applications, especially the process testing of steel manufacturing. We propose an approach called the second-order cone programming (SOCP) optimized multiple kernel relevance vector machine (MKRVM), which can recognize strip surface defects much better than other methods. The method includes the model parameter estimation, training, and optimization of the model based on SOCP and the classification test. We compare our approach with existing methods on strip surface defect recognition. The results demonstrate that our proposed approach can improve the recognition accuracy and reduce the time costs of the strip surface defect.
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