Antiferromagnets offer a unique combination of properties including the radiation and magnetic field hardness, the absence of stray magnetic fields, and the spin-dynamics frequency scale in terahertz. Recent experiments have demonstrated that relativistic spin-orbit torques can provide the means for an efficient electric control of antiferromagnetic moments. Here we show that elementary-shape memory cells fabricated from a single-layer antiferromagnet CuMnAs deposited on a III–V or Si substrate have deterministic multi-level switching characteristics. They allow for counting and recording thousands of input pulses and responding to pulses of lengths downscaled to hundreds of picoseconds. To demonstrate the compatibility with common microelectronic circuitry, we implemented the antiferromagnetic bit cell in a standard printed circuit board managed and powered at ambient conditions by a computer via a USB interface. Our results open a path towards specialized embedded memory-logic applications and ultra-fast components based on antiferromagnets.
The magnetic order in antiferromagnetic materials is hard to control with external magnetic fields. Using X-ray Magnetic Linear Dichroism microscopy, we show that staggered effective fields generated by electrical current can induce modification of the antiferromagnetic domain structure in microdevices fabricated from a tetragonal CuMnAs thin film. A clear correlation between the average domain orientation and the anisotropy of the electrical resistance is demonstrated, with both showing reproducible switching in response to orthogonally applied current pulses. However, the behavior is inhomogeneous at the submicron level, highlighting the complex nature of the switching process in multi-domain antiferromagnetic films.Antiferromagnetic (AF) materials are of increasing interest both for fundamental physics and applications. Recent advances in detecting and manipulating AF order electrically have opened up new prospects for these materials in basic and applied spintronics research [1][2][3][4][5][6][7]. Of particular interest is the Néel order spin-orbit torque (NSOT) [6], recently demonstrated in the collinear AF CuMnAs [7], where a current-induced local spin polarization can exert a rotation of the magnetic sublattices. NSOT is closely analogous to the spin-orbit torque in ferromagnets with broken inversion symmetry, in which electrical currents induce effective magnetic fields that can be used to switch the magnetization direction [8,9]. The tetragonal CuMnAs lattice [10] is inversion symmetric, so that zero net spin polarization is generated by a uniform electric current. However, its Mn spin sublattices form inversion partners, resulting in local effective fields of opposite sign on the AF-coupled Mn sites [6,11]. These staggered current-induced fields can be large enough to cause a non-volatile rotation of the AF spin axis [7].Current-induced rotations of AF moments can be detected electrically using anisotropic magnetoresistance (AMR), a dependence on the relative orientation of the current and spin axes which is present in both ferromagnetic and AF materials [12][13][14][15]. This provides only spatially averaged information over the probed area of the device, which may be several microns or larger. PhotoEmission Electron Microscopy (PEEM), with contrast enabled by X-ray Magnetic Linear Dichroism (XMLD), provides direct imaging of AF domains with better than 100 nm resolution [16]. Based on differences in absorption of x-rays with linear polarization, XMLD-PEEM has offered valuable insights into the microscopic magnetic properties of AF films [17] and ferromagnet / AF interfaces [18,19]. The measured intensity varies as I 0 + I 2 cos 2 α, where α is the angle between the x-ray polarization and the spin axis [20], so is equally present for AF and FM materials, similar to AMR. The XMLD amplitude given by I 2 also depends on the orientation of the x-ray polarization with respect to the crystalline axes [21,22], and the signal is sensitive to domains within the top few nanometers of the surface.Here, we combin...
Antiferromagnets have several favourable properties as active elements in spintronic devices, including ultra-fast dynamics, zero stray fields and insensitivity to external magnetic fields . Tetragonal CuMnAs is a testbed system in which the antiferromagnetic order parameter can be switched reversibly at ambient conditions using electrical currents . In previous experiments, orthogonal in-plane current pulses were used to induce 90° rotations of antiferromagnetic domains and demonstrate the operation of all-electrical memory bits in a multi-terminal geometry . Here, we demonstrate that antiferromagnetic domain walls can be manipulated to realize stable and reproducible domain changes using only two electrical contacts. This is achieved by using the polarity of the current to switch the sign of the current-induced effective field acting on the antiferromagnetic sublattices. The resulting reversible domain and domain wall reconfigurations are imaged using X-ray magnetic linear dichroism microscopy, and can also be detected electrically. Switching by domain-wall motion can occur at much lower current densities than those needed for coherent domain switching.
We investigate the longitudinal resistance of a semiconductor near-surface two-dimensional electron gas (2DEG) subjected to a magnetic barrier induced by the stray field from a single sub-micron ferromagnetic line on the surface of the device. The amplitude of the magnetic barrier is controlled by the application of an external magnetic field in the plane of the 2DEG. We show that this type of magnetoresistance can be used to deduce properties of the ferromagnetic line, so that our hybrid ferromagnet-semiconductor structure acts as a nanomagnetometer.
Recent breakthroughs in electrical detection and manipulation of antiferromagnets have opened a new avenue in the research of non-volatile spintronic devices. 1-10 Antiparallel spin sublattices in antiferromagnets, producing zero dipolar fields, lead to the insensitivity to magnetic field perturbations, multi-level stability, ultrafast spin dynamics and other favorable characteristics which may find utility in fields ranging from magnetic memories to optical signal processing. However, the absence of a net magnetic moment and the ultra-short magnetization dynamics timescales make antiferromagnets notoriously difficult to study by common magnetometers or magnetic resonance techniques. In this paper we demonstrate the experimental determination of the Néel vector in a thin film of antiferromagnetic CuMnAs 9,10 which is the prominent material used in the first realization of antiferromagnetic memory chips. 10 We employ a femtosecond pump-probe magneto-optical experiment based on magnetic linear dichroism. This table-top optical method is considerably more accessible than the traditionally employed large scale facility techniques like neutron diffraction 11 and Xray magnetic dichroism measurements. [12][13][14] This optical technique allows an unambiguous direct determination of the Néel vector orientation in thin antiferromagnetic films utilized in devices directly from measured data without fitting to a theoretical model.Well-established optical methods 15 enable to study magnetic materials with a high spatial-resolution 16 on short time-scales. 17 In particular, Kerr and Faraday magneto-optical (MO) effects, which are linear in magnetization, are frequently used for the characterization of ferromagnets (FMs). [15][16][17] For antiferromagnets (AFs), the utilization of MO techniques is much more challenging. Several time-resolved studies have been performed on canted antiferromagnets [18][19][20] where the Dzyaloshinskii-Moriya interaction induces a canting of the two AF spin-sublattices with an angle of about 1° which leads to a small net magnetization. These canted AFs are, therefore, much easier for the experimental study because despite their antiferromagnetic ordering it is still possible to influence the spins with relatively weak magnetic fields and, moreover, Kerr and Faraday effects can be used for the characterization of their magnetic ordering. For fully compensated AFs the signals from oppositely oriented magnetic sublattices cancel for MO effects linear (i.e. odd) in magnetization which leaves * Electronic mail: nemec@karlov.mff.cuni.cz 2 only MO effects quadratic (even) in magnetization as suitable probes for these materials. 14 Quadratic MO effects have been reported for many magnetic materials. [15][16][17]21 However, practical utilization of quadratic MO effects for the characterization of magnetic materials is much less common than utilization of linear MO effects. 14,22,23 One reason for this is that quadratic MO effects are typically much weaker than linear MO effects. 14 Moreover, the experim...
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