Electrical models of liquid crystal display (LCD) have been studied and used in design simulation. Using the right LCD models is indispensable to accomplish high-quality and highly reliable LCDs. This paper presents a cell panel electrical test (Cell-E Test) for evaluating the electrical characteristics of LCDs. The Cell-E Test was derived from in-process electrical testing for thin film transistor arrays, and utilizes charge measurement for measuring the capacitance value of a pixel. The capacitance-voltage (C-V) and capacitance-time (C-t) characteristics can be measured using a sweeping-applied voltage and based on the period of applying voltage in the Cell-E Test. In this study, actual C-V and C-t characteristics were measured by applying the Cell-E Test to a twisted-nematic active-matrix LCD (TN AM-LCD). The parameters of liquid crystal models were extracted from the data measured using the least-squares method, to show that design models can be verified with the actual parameters of cell panels through the Cell-E Test.
This article proposes the assessment of liquid crystal display (LCD) image defects based on electrical models which are also used for the design of liquid crystal (LC) cell panels. The effects of image defects on a LC pixel electrical model are analyzed, and the test method for assessing image defects using the electrical model is provided. Experimental results show the validity of the analysis and effectiveness of the proposed test method.
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