The superconductor-insulator transition (SIT) is an excellent example of a quantum phase transition at zero temperature, dominated by quantum fluctuations. These are expected to be very prominent close to the quantum critical point. So far, most of the experimental studies of the SIT have concentrated on transport properties and tunneling experiments that provide indirect information on criticality close to the transition. Here we present an experiment uniquely designed to study the evolution of quantum fluctuations through the quantum critical point. We utilize the Nernst effect, which has been shown to be effective in probing superconducting fluctuation. We measure the Nernst coefficient in amorphous indium oxide films tuned through the SIT and find a large signal on both the superconducting and the insulating sides, which peaks close to the critical point. The transverse Peltier coefficient α_{xy}, which is the thermodynamic quantity extracted from these measurements, follows quantum critical scaling with critical exponents ν∼0.7 and z∼1. These exponents are consistent with a clean X-Y model in 2+1 dimensions.
Ni80Fe20 thin films with high orientation were grown on Si(1 0 0) using pulsed laser ablation. The anisotropic magnetoresistance (AMR) and the planar Hall measurements show a 2.5% resistance anisotropy and a 45% planar Hall voltage change for magnetic field sweep of 10 Oe. The planar Hall sensitivity dR/dH was found to be 900 Ω T−1 compared with a previously reported maximum of 340 Ω T−1 in the same system. Also these films are found to withstand repeated thermal cycling up to 110 °C and the Hall sensitivity remains constant within this temperature range. This combination of properties makes the system highly suitable for low magnetic field sensors, particularly in geomagnetic and biosensor applications. To elucidate this, we have demonstrated that these sensors are sensitive to Earth's magnetic field. These results are compared with the sputter deposited films which have a very low AMR and planar Hall voltage change as compared with the films grown by PLD. The possible reasons for these contrasting characteristics are also discussed.
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