We report on a digital speckle pattern interferometer that applies a binary diffractive optical element (DOE) to generate double illumination and radial in-plane sensitivity. The application of the DOE ensures independence on the wavelength of the laser used as an illumination source. Furthermore, in-plane sensitivity only depends on the grating period of the DOE. An experimental setup was built allowing the measurement of a set of radial in-plane displacement fields either using a red laser as a light source or a green one. When displacement fields computed from the measured optical phase maps obtained with a red or a green laser were compared, two main results were observed: (a) deviations between mean values ranged only up to 7 nm and (b) phase maps presented the same amount of fringes. In addition, phase maps measured with the red laser were processed as they were obtained with green light. For this case, deviations have ranged only up to 0.5 nm. On the other hand, a set of measurements performed changing the DOE by a conical mirror showed clearly that radial in-plane sensitivity increased when the red laser was changed by the green one.
This paper presents a new configuration of a digital speckle pattern interferometer that uses a binary diffractive optical element (DOE) to achieve radial in-plane sensitivity. The use of the DOE ensures constant sensitivity to the interferometer since it only depends on the grating period and does not depend on the wavelength of the illumination source. The paper describes the principles as well as the concepts of a portable device that was integrated to a drilling module to apply the hole drilling method for residual stresses measurement. Comparative results showed that the combined system can measure residual stress fields with uncertainty comparable with the classical strain gage based hole drilling method, but at least four times faster. A practical application of residual stresses measurement outside the laboratory is briefly presented.
This paper shows the optical setup of a radial in-plane digital speckle pattern interferometer which uses an axis-symmetrical diffractive optical element (DOE) to obtain double illumination. The application of the DOE gives in-plane sensitivity which only depends on the grating period of the DOE instead of the wavelength of the laser used as illumination source. A compact optical layout was built in order to have a portable optical strain sensor with a circular measurement area of about 5 mm in diameter. In order to compare its performance with electrical strain sensors (strain gauges), mechanical loading was generated by a four-point bending device and simultaneously monitored by the optical strain sensor and by two-element strain gauge rosettes. Several mechanical stress levels were measured showing a good agreement between both sensors. Results showed that the optical sensor could measure applied mechanical strains with a mean uncertainty of about 5% and 4% for the maximum and minimum principal strains, respectively.
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