Work temperature is a factor, which has a strong influence on the work of a semiconductor electronic element. Operation of an electronic element in an excessive temperature causes the element not to work correctly. For this reason, monitoring the temperature of the element is necessary. One of the methods, which allows the monitoring of electronic element temperature is thermography. This non-contact method can also be used during the operation of the electronic element. The reading of a thermal camera depends on several factors. One of these factors is the sharpness of the registered thermograms. For this reason, research was carried out to develop a simple tool that allows a clear classification of thermograms of electronic elements into sharp and unsharp thermograms. In the research carried-out, the sharpness of the registered thermograms of electronic elements was determined by different sharpness measures. In the research, it was shown that in the case of thermograms classified as sharp, a smaller error of temperature measurement was obtained with the use of a thermal imaging camera.
The number of components of a thermographic temperature measurement uncertainty budget and their ultimate contribution depend on the conditions in which the measurement is performed. The acquired data determine the accuracy with which the uncertainty component is estimated. Unfortunately, when some factors have to be taken into account, it is difficult to determine the value of the uncertainty component caused by the occurrence of this factor. In the case of a thermographic temperature measurement, such a factor is the lack of sharpness of the registered thermogram. This problem intensifies when an additional macro lens must be used. Therefore, it is decided to commence research to prepare an uncertainty budget of thermographic measurement with an additional macro lens based on the B method described in EA-4/02 (European Accreditation publications). As a result, the contribution of factors in the uncertainty budget of thermographic measurement with additional macro lens and the value of expanded uncertainty were obtained.
This article describes the measuring system and the influence of selected factors on the accuracy of thermographic temperature measurement using a macrolens. This method enables thermographic measurement of the temperature of a small object with an area of square millimeters as, e.g., electronic elements. Damage to electronic components is often preceded by a rise in temperature, and an effective way to diagnose such components is the use of a thermographic camera. The ability to diagnose a device under full load makes thermography a very practical method that allows us to assess the condition of the device during operation. The accuracy of such a measurement depends on the conditions in which it is carried out. The incorrect selection of at least one parameter compensating the influence of the factor occurring during the measurement may cause the indicated value to differ from the correct value. This paper presents the basic issues linked to thermographic measurements and highlights the sources of errors. A measuring stand which enables the assessment of the influence of selected factors on the accuracy of thermographic measurement of electronic elements with the use of a macrolens is presented.
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