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The nature of the interface involved and the structure characteristics of the as-deposited Co/Si multilayer system have been studied. Using the ionbeam sputtering technique, multilayers, having ten bilayers of Co and Si, were deposited. X-ray reflectivity, x-ray standing wave and wide-angle x-ray diffraction techniques were used to study the interface of the system. The x-ray reflectivity curves obtained confirm the good quality of the Co/Si stack. The presence of a silicide layer at the interface is not distinctly visible. The Co is found to be crystalline in nature and it is highly textured. This texture of the Co layer is lost as the Si layer thickness is increased above a particular value. We have performed some preliminary magneto-optical Kerr effect (MOKE) measurements at room temperature, which show that all the samples have ferromagnetic coupling between the different Co layers and that the nature of ferromagnetism is highly governed by the Si layer thickness.

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