Koolen de Vries syndrome (KDVS; MIM 610443) is a genomic disorder caused by a recurrent microdeletion derived from nonallelic homologous recombination mediated by flanking segmental duplications. Clinical manifestations of this syndrome are characterized by intellectual disability, hypotonia, a friendly behavior, distinctive facial features, and epilepsy. Herein, we report a case of 2 girls who revealed global developmental delay, mild facial dysmorphisms, friendly behavior, and epileptic seizure with a de novo 17q21.31 microdeletion detected by chromosomal microarray analysis (CMA). Conventional cytogenetics analysis by GTG-banding showed a female karyotype 46,XX for both girls. CMA revealed a microdeletion spanning approximately 500 kb in 17q21.31 in both girls, encompassing the following genes: CRHR1, MGC57346, CRHR1-IT1, MAPT-AS1, SPPL2C, MAPT, MAPT-IT1, STH, and KANSL1. Haploinsufficiency of one or more of these genes within the deleted region is the most probable cause of the probands' phenotype and is responsible for the phenotype seen in KDVS. CMA is a powerful diagnostic tool and an effective method to identify the de novo 17q21.31 microdeletion associated with KDVS in our probands.

Modern technologies have provided the opportunity to monitor mutations in people in vivo. The subjects of this study were accidentally exposed to 137Cesium in a radiological accident that occurred in September 1987 in Goiânia, Brazil, during which more than 150 people received doses greater than 0.1 Gy and as high as 7 Gy. The objective of this study was to determine how long the hprt mutant T-cells in the peripheral blood contribute to mutant frequency by examining the time-course of the T-lymphocyte response to ionizing radiation. This report describes the results obtained over a period of 2.3 to 4.5 years subsequent to the accident, from 11 subjects with doses ranging from 1 to 7 Gy, and from nine control subjects selected from the same population. The mean In MF (+/- SE) of the control group was 2.5 (+/- 0.2) + In10(-6). The exposed group had a significantly increased mutant frequency; the mean In MF (+/- SE) were 3.3 (+/- 0.3) + In10(-6), 2.8 (+/- 0.2) + In10(-6), and 2.3 (+/- 0.2) + In10(-6), in the years 1990-1992 respectively. Based on the decline of mutant frequency and using Buckton's models [Buckton et al. (1967): Nature 214:470-473], we demonstrated that mutant T-cells have a short-term memory with a half-life of 2.1 years. This relatively short half-life limits the effective use of the hprt assay as the method of choice to monitor past exposure. The data also demonstrate a positive correlation with age, and an inverse correlation with plating efficiency.

The current study comprises the analysis of mutations in 10 individuals accidentally exposed to cesium‐137 during the 1987 radiological accident in Goiânia, Brazil. Their exposures were among the highest experienced, ranging from 1 to 7 Gy. Peripheral T‐lymphocyte samples were obtained 3.3 years after the original exposure and mutation was studied at the hprt locus using the 6‐thioguanine‐resistance selection assay. The mutational spectrum for the exposed population is comprised of 90 independent mutants. Based on T‐cell receptor analysis, only 5% (5/95) were clonally related. Mutants were initially studied using RT‐PCR and directly sequenced using an automated laser fluorescent DNA sequencer. Mutants that repeatedly failed to produce cDNAs were studied using a multiplex PCR assay with genomic DNA. Missense mutations were the most frequent event recovered, comprising 40% (23/57) of the spectral sample. An excess of events involving A:T base pairs was observed, exhibiting a significant difference (χ2 = 12.7, P = 0.0004) when compared to the spontaneous spectrum. This finding may reflect the effect of ionizing radiation‐induced damage, suggesting a potential similarity to radiation effects in prokaryotes. At the genomic level, 36.7% (33/90) of the mutants exhibited gross structural alterations, as detected by multiplex PCR. Deletion events were over‐represented in our spectral sample, displaying a twofold increase when compared to the frequency observed in the spontaneous mutation database. Environ. Mol. Mutagen. 30:385–395, 1997 © 1997 Wiley‐Liss, Inc.