Nowdays, nanocomposites containing ZnO with various morphologies and graphene, graphene oxide (GO) or reduced graphene oxide (rGO) have been attracting many researchers according to their properties and board application in optoelectronic devices. In this study, rGO/ZnO nanorods were synthesized using different procedures. In the first procedure, ZnO nanorods prepared by using the hydrothermal method. In the second procedure, the surface of ZnO nanorods was coated with rGO using the drop coating process. The pure ZnO, rGO and rGO/ZnO nanorods were characterized by X-ray diffraction (XRD) and the average crystallite size was calculated using Debye-Scherrer equation.
The concept of non-ionizing energy loss (NIEL) has been demonstrated to be a successful approach to describe the displacement damage effects in silicon materials and devices. However, some discrepancies exist in the literature between experimental damage factors and theoretical NIELs. 60 Co gamma rays having a low NIEL is an interesting particle source that can be used to validate the NIEL scaling approach. This paper presents different 60 Co gamma ray NIEL values for silicon targets. They are compared with radiation-induced increase in thermal generation rate of minority carriers per unit fluence. The differences between the different models, including one using molecular dynamics, are discussed. I.
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