We investigate the light-matter interaction of a quantum dot with the electromagnetic field in a lossy microcavity and calculate emission spectra for non-zero detuning and dephasing. It is found that dephasing shifts the intensity of the emission peaks for non-zero detuning. We investigate the characteristics of this intensity shifting effect and offer it as an explanation for the non-vanishing emission peaks at the cavity frequency found in recent experimental work.

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We report on the optical and mechanical characterization of arrays of parallel micromechanical membranes. Pairs of high-tensile stress, 100 nm thick silicon nitride membranes are assembled parallel to each other with separations ranging from 8.5 to 200 μm. Their optical properties are accurately determined using transmission measurements under broadband and monochromatic illuminations, and the lowest vibrational mode frequencies and mechanical quality factors are determined interferometrically. The results and techniques demonstrated are promising for investigations of collective phenomena in optomechanical arrays.

We present a simple fabrication method for the realization of suspended GaAs nanomembranes for cavity quantum optomechanics experiments. GaAs nanomembranes with an area of 1.36 mm by 1.91 mm and a thickness of 160 nm are obtained by using a two-step selective wet-etching technique. The frequency noise spectrum reveals several mechanical modes in the kilohertz regime with mechanical Q-factors up to 2,300,000 at room temperature. The measured mechanical mode profiles agree well with a taut rectangular drumhead model. Our results show that GaAs nanomembranes provide a promising path towards quantum optical control of massive nanomechanical systems.Comment: 3 pages, 3 figure

We report on the realization of silicon nitride membranes with enhanced and electrically tunable reflectivity. A high contrast grating is directly patterned using electron beam lithography on suspended 200 nm-thick, high stress commercial films. We show that the grating transverse profile can be measured in situ using localized cuts of the suspended film with a Focused Ion Beam. A Fano resonance is observed at 937 nm in the transmission spectrum of TM polarized light impinging on the membrane at normal incidence, leading to an increase in its reflectivity from 10% to 78%. By mounting membrane chip on a ring piezoelectric transducer and applying a compressive force to the corners of the film we subsequently show that it is possible to shift the transmission spectrum by 0.23 nm.