We present a method to determine micro and nano in-plane displacements based on the phase singularities generated by application of directional wavelet transforms to speckle pattern images. The spatial distribution of the obtained phase singularities by the wavelet transform configures a network, which is characterized by two quasi-orthogonal directions. The displacement value is determined by identifying the intersection points of the network before and after the displacement produced by the tested object. The performance of this method is evaluated using simulated speckle patterns and experimental data. The proposed approach is compared with the optical vortex metrology and digital image correlation methods in terms of performance and noise robustness, and the advantages and limitations associated to each method are also discussed.
A simplified method for object phase recovering is implemented in temporal speckle pattern interferometry when the employed interferometer admits the introduction of a temporal carrier, and the well-known two-beam interferometry equation is verified. The spatiotemporal evolution of the object phase is isolated by modulating the acquired interferometric intensity signals with a known temporal carrier in order to carry out its analysis by using a bivariate empirical mode decomposition framework that avoids the application of the Hilbert transform, which is not suitable for intensity signals with abrupt fluctuations. The advantages and limitations of this technique are analyzed and discussed by comparing computation time and phase recovery capability with well-known phase-retrieval methods by means of numerical simulations and experimental data.
This paper presents a method for amplitude and phase retrieval in simultaneous π/2 phase-shifting heterodyne interferometry. The used optical setup admits the introduction of a temporal carrier and simultaneously verifies the two-beam interferometry equation for each intensity signal, which are π/2 rad out of phase (quadrature). The spatiotemporal recovering process is obtained by isolating the object amplitude and phase using wavelet transform analysis of the temporal series composed by the difference between the measured pixel intensities corresponding to each quadrature signal. This process is subsequently improved by introducing a framework based on the synchrosqueezing transform, which recovers the data of interest with higher accuracy when very low scattering amplitudes and phase excursions must be determined in noisy working conditions. The advantages and limitations of the presented method are analyzed and discussed using numerical simulations and also experimental data obtained from temporal speckle pattern interferometry.
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