3D profile measurement of an object is studied experimentally by using a standard fringe projection technique consisting of a CCD camera and a digital projector. The height profile of the object is calculated through the phase change distribution of the projected fringes from the phase and phase gradient of the wavelet transform. Experimental results for the Fourier transform profilometry algorithm are compared with the results of wavelet analysis.
The surface profile of a rough object is obtained by white light interferometry. The real and noisy simulated correlograms are analysed by using sliding average, continuous wavelet transform and a new algorithm that is called the continuous wavelet transform phase method. Measurement repeatability is calculated for each algorithm and it has been shown that the continuous wavelet transform phase method gives a smaller peak to valley value and standard deviation than other methods. Hence, this algorithm can be used to obtain a good repeatability or standard deviation in white light interferometry.
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