Acoustic characterization of doped silica glasses with a GeO,, Pz05, F, TiO,, Al,Oj, or B,O, dopant having different concentrations is presented. Quantitative measurements were performed with a 225-MHz line-focus-beam scanning acoustic microscope. The acoustic velocity variation due to different dopant concentrations is given. It has been found that the AI,O, dopant increases, but the other dopants decrease, the acoustic velocity as compared with that of the pure fused silica. We have also found that the fractional change in acoustic velocity is greater than that in refractive index for a given dopant concentration.
We describe a system demonstrator based on vertical-cavity surface-emitting lasers, metal-semiconductor-metal detectors, printed circuit board (PCB) level optoelectronic device packaging, a compact bulk optical relay, and novel barrel/PCB optomechanics. The entire system was constructed in a standard VME electrical backplane chassis and was capable of operating at >1.7 Gbit/s of aggregate data capacity. In addition to the component technologies developed, we describe operational testing and characterization of the demonstrator.
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