In this report, a new advanced prism coupler with temperature-controlled system is utilised for measuring the refractive indices and thickness of polymer thin film. This coupler is capable of measuring the variation of refractive indices with temperature. The refractive indices, n and thickness, d of the materials have been measured in the temperature range of 30°C to 80°C. The double-layered waveguide on silicon, which uses Ormocer b59 (Ormocore) as the core layer and Ormocer b66 (Ormoclad) as the bottom cladding layer, have been fabricated and used for the measurement. The thermooptic coefficients (dn/dt) for both materials have been obtained.
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