Articles you may be interested inChemical alteration of the native oxide layer on InP(111) by exposure to hyperthermal atomic hydrogen XPS techniques are used for a comparative study of ion induced effects in simple oxides (Zr02, Si0 2 , Ti0 2 ) and complex oxides (ZrSi0 4 , CaTiSi0 5 , La z Ti0 5 , PbTi0 3 ). We have found that reduction effects in simple and complex oxides differ. The interpretation of altered layer composition has been qualitatively considered in terms of the preferential loss of oxygen and reverse chemical reactions.

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The article deals with the basic aspects of ion-stimulated Auger process. The authors suggested using the standard Everhart-Thornley detector to obtain a contrast of ion-induced Auger electrons on cross-beam systems using mathematical processing of the image which is based on spectroscopic information. As a result, this work consisted of obtaining images that showed the contrast distribution of Auger electrons and the sputtering yield on aluminum thin films samples.