The future information infrastructure will be affected by limited bandwidth of optical networks, high energy consumption, heterogeneity of network segments, and security issues. As a solution to all problems, we advocate the use of both electrical basis functions (orthogonal prolate spheroidal basis functions) and optical basis functions, implemented as FBGs with orthogonal impulse response in addition to spatial modes. We design the Bragg gratings with orthogonal impulse responses by means of discrete layer peeling algorithm. The target impulse responses belong to the class of discrete prolate spheroidal sequences, which are mutually orthogonal regardless of the sequence order, while occupying the fixed bandwidth. We then design the corresponding encoders and decoders suitable for all-optical encryption, optical CDMA, optical steganography, and orthogonal-division multiplexing (ODM). Finally, we propose the spectral multiplexing-ODM-spatial multiplexing scheme enabling beyond 10 Pb/s serial optical transport networks.
A monoenergetic slow positron beam has been used for the first time to profile porous silicon films. High values of the Doppler-broadened line shape parameters are observed, which correspond to positron annihilation within the porous layers and these are attributed to the decay of para-positronium. After allowing for the reduced density of the porous film, fitted values of thickness were deduced which were in reasonable agreement with values obtained from ellipsometry measurements. Low values of the Doppler parameters observed for the two samples with the thinnest films are attributed to oxide residing at the interface of the porous and bulk silicon regions. Etching the samples in a solution of 48% hydrogen fluoride reduced the porous film thickness significantly, suggesting that a considerable amount of the film consists of SiO2. A four-component convolution analysis routine is used to analyze the individual 511 keV annihilation peaks, the result of which confirms the formation of positronium within the porous layer. Positron annihilation is shown to be a promising method for the nondestructive investigation of thin porous films.
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