The decomposition of H 2 0 and D 2 0 on silicon surfaces was studied using transmission Fourier-Transform Infrared (FTIR) spectroscopy. These FHTR studies were performed in-situ in an ultra-high vacuum chamber using high surface area porous silicon samples. The FTIR spectra revealed that H 2 0 (D 2 0) initially dissociates upon adsorption at 300 K to form SiH (SiD) and SiOH (SiOD) surface species, i.e. H 2 0-+ SiH + SiOH. The decomposition of these surface species was then monitored using the Si-H (Si-D) stretch at 2100 cm" 1 (1518 cm' 1), SiO-H (SiO-D) stretch at 3680 cm" 1 (2713 cm" 1) and the Si-O-Si stretch at 900-1100 cm" 1. As the silicon surface was annealed to 650 K, the FTIR spectra revealed that the SiOH surface species progressively decomposed to Si-O-Si species and additional Sill species, i.e. SiOH-* SiH + SiOSi. Above 650 K, the Sill surface species decreased concurrently with the desorption of H 2 from the porous silicon surface. New blue-shifted infrared features in the Si-H stretching region were observed at 2119 cm" 1 , 2176 cm" 1 and 2268 cmr" after annealing above 600 K. Additional infrared studies of partially hydrogen-covered porous silicon surfaces exposed to 02 suggested that these blue-shifted Si-H stretching vibrations were associated with silicon surface atoms backbonded to one, two or three oxygen atoms, respectively.
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