A new furnace, based on a halogen lamp, and a sample cell have been designed and constructed for in situ X-ray absorption spectroscopy experiments in conventional and dispersive mode (transmission and fluorescence geometries). The main application of the apparatus is thermal treatment studies under controlled conditions for dynamical processes. The sol-gel (gelatin) method has been utilized to synthesize NiO nanoparticles. During this heating process, in situ Ni K-edge X-ray absorption near-edge structural measurements provided evidence of the evolution of a Ni environment until complete NiO nanoparticle crystallization. This case is reported in order to show the furnace performance in dispersive mode.
Polycrystalline NaF films were grown by e-beam assisted physical evaporation on amorphous silica substrates kept, during film growth, at constant temperatures ranging from 40 degrees C to 400 degrees C. The structural characterization of the films was performed by X-ray diffraction and by scanning electron microscopy. Irradiating the films with a 15 keV electron beam induced the formation of F and F-aggregate colour centres stable at room temperature. Absorption and photoemission measurements were performed and indicated a dependence of coloration on the deposition conditions
The CARNAÚBA beamline is the tender-to-hard X-ray nanoprobe under commissioning for the new source Sirius at the Brazilian Synchrotron Light Laboratory (LNLS). The all-achromatic optics relies on horizontal deflection mirrors, a horizontal secondary source aperture (SSA), and Kirkpatrick–Baez (KB) mirrors to reach beam size down to ~30x30 nm2 at the sample position. To handle the highly focused power density of the pink beam and reach the desired stability for the horizontal secondary source, essential for the desired focusing and coherent properties at the sample position, we present here an SSA device based on a cryogenically cooled Si crystal in a channel-cut geometry. The crystal slabs define the channel aperture, which is controlled by a fine rotation. Simultaneously to the aperture function, the device plays the key role of beam position monitor and beam diagnostic. The scattered signal from the slabs is used to monitor the horizontal beam position during experiments and serves as a feedback input for the pitch control system of the upstream focusing mirror to stabilize the beam intensity and wavefront. The Bragg magnifier geometry of the device spreads the beam over the slabs, allowing the diffracted image of the beam to be collected by an area detector. The beam spread on the slabs also reduces the power density reaching the device, keeping it stable and under controlled temperatures.
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