We review the ways o performing super high resolution optical miorosoopy of opaque samples using suraoe electromagnetic waves (SEW) ror the cases when the light signal is detected in the near or in the ar held. An immersion method o SEW cxc itation is presented. The method enables one to perform the superhigh resolution SEW-microscopy or conducting and semi conducting
Opportunities offered by the immersion surface-plasmon (SP) microscopyfor acceleration detection have been investigated A scheme ofan immersion SP-accelerometer, enabling one to detect a linear acceleration andfind it's direction, as well as to evaluate the module ofa uniform acceleration with the accuracy of 106m/s2, is considered
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