Supersonic helium beams are used in a wide range of applications, for example surface scattering experiments and, most recently, microscopy. The high ionization potential of neutral helium atoms makes it difficult to build efficient detectors. Therefore, it is important to develop beam sources with a high centre line intensity. Several approaches for predicting the centre line intensity exist, with the so-called quitting surface model incorporating the largest amount of physical dependencies in a single analytical equation. However, until now only a limited amount of experimental data has been available. Here we present a comprehensive study where we compare the quitting surface model with an extensive set of experimental data. In the quitting surface model the source is described as a spherical surface from where the particles leave in a molecular flow determined by Maxwell-Boltzmann statistics. We use numerical solutions of the Boltzmann equation to determine the properties of the expansion. The centre line intensity is then calculated using an analytical integral. This integral can be reduced to two cases, one which assumes a continuously expanding beam until the skimmer aperture, and another which assumes a quitting surface placed before the aperture. We compare the two cases to experimental data with a nozzle diameter of 10 µm, skimmer diameters ranging from 4 µm to 390 µm, a source pressure range from 2 to 190 bar, and nozzleskimmer distances between 17.3 mm and 5.3 mm. To further support the two analytical approaches, we have also performed equivalent ray tracing simulations. We conclude that the quitting surface model predicts the centre line intensity of helium beams well for skimmers with a diameter larger than 120 µm when using a continuously expanding beam until the skimmer aperture. For the case of smaller skimmers the trend is correct, but the absolute agreement not as good. We propose several explanations for this, and test the ones that can be implemented analytically.
The manipulation of neutral atoms and molecules via their de Broglie wave properties, also referred to as de Broglie matter wave optics, is relevant for several fields ranging from fundamental quantum mechanics tests and quantum metrology to measurements of interaction potentials and new imaging techniques. However, there are several challenges. For example, for diffractive focusing elements, the zero-order beam provides a challenge because it decreases the signal contrast. Here we present the experimental realization of a zero-order filter, also referred to as an order-sorting aperture for de Broglie matter wave diffractive focusing elements. The zero-order filter makes it possible to measure even at low beam intensities. We present measurements of zero-order filtered, focused, neutral helium beams generated at source stagnation pressures between 11 and 81 bars. We show that for certain conditions the atom focusing at lower source stagnation pressures (broader velocity distributions) is better than what has previously been predicted. We present simulations with the software ray-tracing simulation package MCSTAS using a realistic helium source configuration, which gives very good agreement with our measurements.
In neutral helium atom microscopy, a beam of atoms is scanned across a surface. Though still in its infancy, neutral helium microscopy has seen a rapid development over the last few years. The inertness and low energy of the helium atoms (less than 0.1 eV) combined with a very large depth of field and the fact that the helium atoms do not penetrate any solid material at low energies open the possibility for a non-destructive instrument that can measure topology on the nanoscale even on fragile and insulating surfaces. The resolution is determined by the beam spot size on the sample. Fast resolution change is an attractive property of a microscope because it allows different aspects of a sample to be investigated and makes it easier to identify specific features. However up till now it has not been possible to change the resolution of a helium microscope without breaking the vacuum and changing parts of the atom source. Here we present a modified source design, which allows fast, step wise resolution change. The basic design idea is to insert a moveable holder with a series of collimating apertures in front of the source, thus changing the effective source size of the beam and thereby the spot size on the surface and thus the microscope resolution. We demonstrate a design with 3 resolution steps. The number of resolution steps can easily be extended.
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