We report on the magnetoresistance of textured films consisting of 3d-ferromagnetic layers sandwiched by Pt. While the conventional cos 2 φ behavior of the anisotropic magnetoresistance (AMR) is found when the magnetization M is varied in the film plane, cos 2n θ contributions (2n ≤ 6) exist for rotating M in the plane perpendicular to the current. This finding is explained by the symmetry-adapted modeling of AMR of textured films demonstrating that the cos 2 θ behavior cannot be used as a fingerprint for the presence of spin Hall magnetoresistance (SMR). Further, the interfacial MR contributions for Pt=Ni=Pt contradict the SMR behavior confirming the dominant role of AMR in all-metallic systems.