An X-ray diffraction method is developed for the determination of the distribution of temperature and interplanar spacing in a single-crystal plate. In particular, the temperature and the interplanar spacing differences in two different parts of a quartz single crystal of X-cut are experimentally determined depending on the value of the temperature gradient applied perpendicularly to the reflecting atomic planes (10 " 1 11). The temperature distribution along the direction perpendicular to the reflecting atomic planes (10 " 1 11) and the interplanar spacing distribution of atomic planes (10 " 1 11) are determined as well.
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