A s demity and complexity increase, the search for new test and analysis techniques can impact the role of failure analysis, especially in the correct identification qf ,failure niechanisnrs for root cause fixes to ensure timely productization of a new product in a relatively competitive market. Design for Testability (Dm) oflers some flexibility in trying to meet the demands made on the production test and on the defect analyses by reducing the time per test and in helping to carry out some specijc type of tests. This paper presents test results of investigations carried out with the help of sotne DFT tests on the :-Megabit, 4-Megabit & 16-Megabit Dynamic Rancloni Access A4ernories (DRAMS) to detect the cause of an electrica1,fault in more detail. Several case examples depicting this work will be presented.
A wide locking range injection locked frequency divider (ILFD) with a low power consumption for 60 GHz applications is presented. The locking range of the ILFD is enhanced by reducing the parasitic capacitances of the transistors. The cross-coupled transistor and injected transistors are integrated to become a compact structure, which exhibits simple routing and induces less parasitic capacitances. To verify the proposed structure, the ILFD was fabricated using 65 nm CMOS technology. It has a measured locking range of 55.3 GHz to 67 GHz (19%) with 0 dBm input power. The circuit dissipates 1.98 mW at 0.5 V supply voltage without the output buffers.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.