Monolithically stacked multijunction solar cells based on III–V semiconductors materials are the state-of-art of approach for high efficiency photovoltaic energy conversion, in particular for space applications. The individual subcells of the multi-junction structure are interconnected via tunnel diodes which must be optically transparent and connect the component cells with a minimum electrical resistance. The quality of these diodes determines the output performance of the solar cell. The purpose of this work is to contribute to the investigation of the tunnel electrical resistance of such a multi-junction cell through the analysis of the current-voltage (J-V) characteristics under illumination. Our approach is based on an equivalent circuit model of a diode for each subcell. We examine the effect of tunnel resistance on the performance of a multi-junction cell using minimization of the least squares technique.
Because of their state of art technology, GaAs solar cells are generally preferred for spatial applications. Exposure to proton and electron irradiations, solar cells suffer significant degradation in their performance such as short circuit current and open circuit voltage. Adding a window layer helps in effectively reducing the surface recombination at the emitter surface of the solar cell without absorbing the useful light required for the device. It remains to study the physics of the window-emitter hetero-interface in order to understand how the window layer presence increases the minority carrier lifetime of the solar cell exposed to particles irradiation. In this work Numerical simulation has been used to study the AlxGa1-xAs window composition effect on the current-voltage characteristics of a GaAs solar cell under AM0 illumination and exposed to 1 MeV electron irradiation. To predict the effect of window layers on solar cells degradation, the current voltage characteristic are evaluated for different electron irradiation fluences. The findings are supported by experimental data. They lead us to get to know how the window layer improves resistance to electron irradiation through its own parameters.
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