Cherenkov radiation generated by a relativistic electron bunch in a rectangular dielectric-loaded waveguide is analyzed under the assumption that the dielectric layers are inhomogeneous normal to the beam path. We propose a method that uses eigenfunctions of the transverse operator applied to develop a rigorous full solution for the wakefields that are generated. The dispersion equation for the structure is derived and the wakefield analysis is carried out. The formalism developed here allows the direct solution of the inhomogeneous system of Maxwell equations, an alternative analytic approach to the analysis of wakefields in contrast to the previously used impedance method for rectangular structure analysis. The formalism described here was successfully applied to the analysis of rectangular dielectric-lined structures that have been recently beam tested at the Argonne (ANL/AWA) and Brookhaven (BNL/ATF) accelerator facilities.

No abstract

No abstract

No abstract

No abstract

We consider a semi-infinite open-ended cylindrical waveguide with uniform dielectric filling placed into collinear infinite vacuum waveguide with larger radius. Electromagnetic field produced by a point charge or Gaussian bunch moving along structure's axis from the dielectric waveguide into the vacuum one is investigated. We utilize the modified residue-calculus technique and obtain rigorous analytical solution of the problem by determining coefficients of mode excitation in each subarea of the structure. Numerical simulations in CST Particle Studio are also performed and an excellent agreement between analytical and simulated results is shown. The main attention is paid to analysis of Cherenkov radiation generated in the inner dielectric waveguide and penetrated into vacuum regions of the outer waveguide. The discussed structure can be used for generation of Terahertz radiation by modulated bunches (bunch trains) by means of high-order Cherenkov modes. In this case, numerical simulations becomes difficult while the developed analytical technique allows for efficient calculation of the radiation characteristics. 41.60.Bq, 84.40.Az, 42.25.Fx I.

No abstract

No abstract