The early stages of nanocrystallization in amorphous Fe73.8Si13B9.1Cu1Nb3.1 ribbons and microwires were compared in terms of their internal stress effects. The microstructure was investigated by the X-ray diffraction method. Classical expressions of crystal nucleation and growth were modified for microwires while accounting for the internal stress distribution, in order to justify the XRD data. It was assumed that, due to the strong compressive stresses on the surface part and tensile stresses on the central part, crystallization on the surface part of the microwire proceeded faster than in the central part. The results revealed more rapid nanocrystallization in microwires compared to that in ribbons. During the initial period of annealing, the compressive surface stress of a microwire caused the formation of a predominantly crystallized surface layer. The results obtained open up new possibilities for varying the high-frequency properties of microwires and their application in modern sensorics.
Amorphous microwires of Fe73.8Si13B9.1Cu1Nb3.1 andFe77.5Si13.5B9 composition fabricated by the Ulitovsky--Taylor method were studied. The samples with the glass shell removed were heated at temperatures of 753 K and 703 K for 20 min, afterwards, their structure was examined using X-ray diffraction. Subsequently, the thermally treated samples were chemically etched and X-ray diffraction study of the structure was again carried out. Experimental results on the predominant crystallization of near-surface regions were discussed assuming that mechanical stresses affect the nucleation and growth of nanocrystals. Keywords: amorphous materials, stress distribution, nanocrystallization, X-ray diffraction.
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