Abstract:The results of an experimental study on transient phenomena in a closed cycle disk MHD generator are described in this paper. The transient phenomena were caused by a steplike change of load resistance during testing of the shock‐tube driven disk MHD generator. The load resistance was varied by using an IGBT (insulated gate bipolar transistor) installed in the load circuit. When the load resistance was changed from 0.096 Ω to 2.5 Ω, overshoot of the Hall output voltage and of the Hall electric field was observ… Show more
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