2021
DOI: 10.3788/gzxb20215004.0406004
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基于白光扫描干涉法的光纤折射率分布的测量

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Cited by 1 publication
(2 citation statements)
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“…where h is the height information of a certain point on the test surface, i z is the scanned location information and () i Iz is the interference intensity. The accuracy of this method is affected by the background light intensity, and it is necessary to ensure that the peak position of the interference signal is at the center of the data as much as possible to improve the measurement accuracy [7,35].…”
Section: Center Of Gravity Methods For Solving the Height Informationmentioning
confidence: 99%
See 1 more Smart Citation
“…where h is the height information of a certain point on the test surface, i z is the scanned location information and () i Iz is the interference intensity. The accuracy of this method is affected by the background light intensity, and it is necessary to ensure that the peak position of the interference signal is at the center of the data as much as possible to improve the measurement accuracy [7,35].…”
Section: Center Of Gravity Methods For Solving the Height Informationmentioning
confidence: 99%
“…The white-light interference-microscope objective is the core component of a white-light interferometer system. Because of the short coherence length of a white-light source, the optical path of two beams should be matched perfectly to produce interferometry [6][7][8][9][10] . However, asymmetric beam splitters will inevitably introduce additional dispersion and the dispersion will be changed by the tilt of the reference mirror, which affects the measurement accuracy.…”
Section: Introductionmentioning
confidence: 99%