基于径向偏振光的波片参数测量方法

Fanchun, 唐凡春 Tang; Yang, 步扬 Bu; Fang, 吴芳 Wu; Xiangzhao, 王向朝 Wang

doi:10.3788/cjl202249.1704006

中国激光

2022

DOI: 10.3788/cjl202249.1704006

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基于径向偏振光的波片参数测量方法

唐凡春 Tang Fanchun¹,

步扬 Bu Yang²,

吴芳 Wu Fang³

et al.

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石英晶体椭偏测量中的穆勒矩阵模型

Zhao Yu,

Zhang Linghao,

Zeng Aijun

et al. 2023

中国激光

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Objective Quartz crystal is an important birefringence material, which is widely used in optical related fields. The two main optical parameters of quartz crystal wave plate are phase retardation and fast axis azimuth. Due to the influence of manufacturing process, these two actual parameters will deviate from the theoretical value, so it is usually necessary to accurately measure the optical parameters before use. Ellipsometry is usually used to measure the parameters of quartz crystal in a wide spectrum , but the existing ellipsometric measuring instruments often assume that the optical axis of the crystal is aligned with the measuring optical path, which introduces measurement error, especially in the ultraviolet band. Therefore, it is necessary to propose a fitting model for accurate

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石英晶体椭偏测量中的穆勒矩阵模型

Zhao Yu,

Zhang Linghao,

Zeng Aijun

et al. 2023

中国激光

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show abstract

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基于径向偏振光的波片参数测量方法

Cited by 1 publication

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石英晶体椭偏测量中的穆勒矩阵模型

石英晶体椭偏测量中的穆勒矩阵模型

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