2021
DOI: 10.15407/ujpe66.9.792
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Електричні властивості і енергетичні параметри фото-чутливих гетероструктур n-Mn2O3/n-CdZnTe

Abstract: Дослiджено умови виготовлення фотодiодних iзотипних гетероструктур n-Mn2O3/n-CdZnTe методом спрей-пiролiзу тонких плiвок бiксбiту a-Mn2O3 на кристалiчнi пiд-кладинки n-CdZnTe. За температурними залежностями I-V -характеристик проаналiзовано механiзми тунелювання електронiв крiзь енергетичний бар’єр гетеропереходу при прямому та зворотному струмах. З’ясована роль енергетичних станiв на межi n-Mn2O3/n-CdZnTe у формуваннi параметрiв бар’єра. На основi C-V –характеристик встановлено динамiку змiни i взаємозв’язок … Show more

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Cited by 2 publications
(3 citation statements)
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“…The electron affinity energy of Mn2O3   4.45 eV determined by the Kelvin method [13] was used, which is characteristic of Mn2O3 films produced by the spray pyrolysis method. The used value of the band gap Eg(Mn2O3)  2.12 eV, which is obtained from optical studies of Mn2O3 films, was tested when constructing the energy diagram of n-Mn2O3/n-CdZnTe heterojunctions [10]. The depth of the Fermi level 1  EC -EF  0.41 eV in the band gap of n-Mn2O3 was calculated using the expression for non-degenerate semiconductors [18]:…”
Section: Resultsmentioning
confidence: 99%
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“…The electron affinity energy of Mn2O3   4.45 eV determined by the Kelvin method [13] was used, which is characteristic of Mn2O3 films produced by the spray pyrolysis method. The used value of the band gap Eg(Mn2O3)  2.12 eV, which is obtained from optical studies of Mn2O3 films, was tested when constructing the energy diagram of n-Mn2O3/n-CdZnTe heterojunctions [10]. The depth of the Fermi level 1  EC -EF  0.41 eV in the band gap of n-Mn2O3 was calculated using the expression for non-degenerate semiconductors [18]:…”
Section: Resultsmentioning
confidence: 99%
“…This material is non-toxic and cost-effective. As a manganese oxide semiconductor, heterojunctions with g-C3N4 [7], СuOx [8], Fe2O3/Mn2O3 [9], n-Mn2O3/n-CdZnTe [10] are used. Thin films of Mn2O3 with a band gap Eg  2.01÷2.4 eV [11,12] are promising as a frontal material for heterojunctions.…”
Section: Introductionmentioning
confidence: 99%
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