Abstract:The fundamental possibility of measuring the stray fields distributions of magnetic objects in a scanning electron microscope is demonstrated. The main idea of the method is to use a sample holder for operation in the mode of a scanning transmission microscope, additionally equipped with a square diffraction grating. This grating, formed on the basis of a metal film, is placed at some distance under the magnetic sample. Reconstruction of the deflections of transmitted electrons by analyzing the geometric phase… Show more
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