Abstract:The current paper considers the applicability of micro-tomographic methods for the investigation of growth mechanisms of metallic tin whiskers. Tin whiskers are metallic fibers that grow spontaneously from lead-free tin-coated surfaces, causing short circuit related issues in electronic devices, therefore making this phenomenon an interesting topic for in-depth analysis. In order to investigate such minuscule structures by X-rays, a tomographic setup employing a directconverting pixel large area detector based… Show more
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