2004
DOI: 10.1016/j.vacuum.2004.01.033
|View full text |Cite
|
Sign up to set email alerts
|

ZnO–SnO2 transparent conductive films deposited by opposed target sputtering system of ZnO and SnO2 targets

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

5
34
0

Year Published

2006
2006
2019
2019

Publication Types

Select...
8
1

Relationship

0
9

Authors

Journals

citations
Cited by 64 publications
(39 citation statements)
references
References 7 publications
5
34
0
Order By: Relevance
“…1(a) and (b). The XRD pattern of as-deposited ZTO film exhibited only broad peak at 2θ -34 • characteristic of amorphous zinc tin oxide [8,9]. The resistivity of the as-deposited AZO film was 2.9 × 10 −4 cm.…”
Section: Resultsmentioning
confidence: 99%
“…1(a) and (b). The XRD pattern of as-deposited ZTO film exhibited only broad peak at 2θ -34 • characteristic of amorphous zinc tin oxide [8,9]. The resistivity of the as-deposited AZO film was 2.9 × 10 −4 cm.…”
Section: Resultsmentioning
confidence: 99%
“…In the current state of the art there are some scientific publications devoted to preparation and characterization of TOS materials, which concern mainly ZnO, ITO and SnO 2 oxides [6][7][8]. There are also some reports about manufacturing of TOS thin films based on titanium dioxide [9][10][11].…”
Section: Introductionmentioning
confidence: 99%
“…Recently, however, its high cost due to the scarcity (Clarke number is 10 −5 ) and the toxics of indium oxides have been strongly pointed out so that alternative transparent and electro conductive materials have been actively studied over the last two decades [1][2][3][4].…”
Section: Introductionmentioning
confidence: 99%